Nexsa™ spectrometer delivers flexibility to maximize the potential of your material. Flexibility in the forms of multiple-integrated technique options for true correlative data analysis and high throughput while maintain research quality results. The SnapMap brings sample features into focus with its optical view. The optical view helps you pinpoint areas of interest quickly while developing a fully focused XPS image to further define your experiment.
Features
- Insulator Analysis
- High Performance Spectroscopy
- Depth Profiling
- Multi-technique Integration
- Dual-mode ion source for expanded depth profiling capabilities
- Tilt Module for ARXPS measurements
- Avantage Software for instrument control, data processing, and reporting
- Small spot analysis
Applications
- Glass coatings
- Polymers
- Batteries
- Graphene
- Solar cells
- OLEDs
- Metals & oxides
- Bio-surfaces
- Thin Films
- Semiconductors
- CeramicsCatalysts
- Nanomaterials
Optional upgrades
- RAMAN: Spectroscopic technique used to in chemistry to provide a structural fingerprint
- ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
- UPS: Ultra-violet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
- REELS: Reflected electron energy loss spectroscopy provides information on electronic structure and can measure the presence of hydrogen